Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Lee S., Puig T., Obradors X., Usoskin A., Ricart S., Tendeloo G.V., Bartolome E., MOLODYK A., Vlad V.R., Vilardell M., Calleja A., Petrykin V., Meledin A.
Ключевые слова: HTS, YBCO, coated conductors, new, fabrication, inkjet printing, buffer layers, substrate Hastelloy, texture, microstructure, X-ray diffraction, magnetization, hysteresis, critical caracteristics, Jc/B curves, grain size, critical current density intergranular, critical current density intragranular, susceptibility, temperature dependence, experimental results
Ключевые слова: HTS, coated conductors, buffer layers, fabrication, chemical solution deposition, substrate Ni-W, texture, microstructure, measurement technique
Ключевые слова: HTS, YGdBCO, multilayered structures, MOCVD process, coated conductors, heat treatment, fabrication, substrate Hastelloy, buffer layers, critical caracteristics, critical current, thickness dependence, microstructure, X-ray diffraction, current-voltage characteristics, critical current density, experimental results
Ключевые слова: chalcogenide, coated conductors, PLD process, IBAD process, buffer layers, substrate metallic, resistive transition, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy
Ключевые слова: HTS, GdBCO, coated conductors, substrate Ni-W, chemical solution deposition, surface, defects, buffer layers, films epitaxial, precursors, X-ray diffraction, microstructure, aging, fabrication
Ключевые слова: films, sol gel process, buffer layers, films epitaxial, substrate LaAlO3, microstructure, critical caracteristics, Jc/B curves, resistive transition, HTS, YBCO, fabrication
Ключевые слова: HTS, coated conductors, fabrication, IBAD process, template layers, PLD process, buffer layers, films epitaxial, X-ray diffraction, microstructure
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanoparticles, nanocomposites, doping effect, nanoscaled effects, pinning, cap layers, buffer layers, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, pinning force, magnetic field dependence, critical temperature, experimental results
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